June 15, 2007
K-Patents introduces the revolutionary new Semicon Process Refractometer PR-23-MS at Semicon West 2007. This in-line instrument is suitable for real-time chemical concentration monitoring throughout the whole semiconductor fabrication process.
July 9, 2007
K-Patents Semicon Process Refractometer PR-23-MS has been selected a winner of the 2007 Editor's Choice Best Product Award by the Semiconductor International.
May 31, 2007
K-Patents will present the latest innovations in in-line concentration measurement technology at stand 3h17 at the PulPaper 2007 exhibition at the Helsinki Fair Center in June 5-7th, 2007.
Feb 26, 2007
K-Patents introduces a new K-Patents SAFE-DRIVE™ Process Refractometer PR-23-SD, which is a complete heavy-duty system for measuring black liquor dry solids % by weight in kraft chemical pulp mills.
Feb 22, 2007
K-Patents new Teflon Body Refractometer PR-23-M measures the concentrations of process liquids such as etchants, photo resists, developers, strippers and cleaning agents in semiconductor fabs.
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