All News: Recent and Archived News and Press Releases

See us at SEMICON West 2007, South Hall Booth # 2966!

June 15, 2007

K-Patents introduces the revolutionary new Semicon Process Refractometer PR-23-MS at Semicon West 2007. This in-line instrument is suitable for real-time chemical concentration monitoring throughout the whole semiconductor fabrication process.

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K-Patents selected for the 2007 Editors' Choice Best Product

July 9, 2007

K-Patents Semicon Process Refractometer PR-23-MS has been selected a winner of the 2007 Editor's Choice Best Product Award by the Semiconductor International.

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New K-Patents measurement solutions at the PulPaper 2007 exhibition in Helsinki at stand 3h17

May 31, 2007

K-Patents will present the latest innovations in in-line concentration measurement technology at stand 3h17 at the PulPaper 2007 exhibition at the Helsinki Fair Center in June 5-7th, 2007.

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K-Patents New SAFE-DRIVE™ Process Refractometer PR-23-SD

Feb 26, 2007

K-Patents introduces a new K-Patents SAFE-DRIVE™ Process Refractometer PR-23-SD, which is a complete heavy-duty system for measuring black liquor dry solids % by weight in kraft chemical pulp mills.

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Semicon Fabs Discover a New Kind of Measurement

Feb 22, 2007

K-Patents new Teflon Body Refractometer PR-23-M measures the concentrations of process liquids such as etchants, photo resists, developers, strippers and cleaning agents in semiconductor fabs.

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